dc.contributor.author | Yuan, Fuqing | |
dc.contributor.author | Lu, Jinmei | |
dc.date.accessioned | 2024-02-27T13:22:41Z | |
dc.date.available | 2024-02-27T13:22:41Z | |
dc.date.issued | 2023-02-01 | |
dc.description.abstract | Assessment of reliability of personal computer is a challenge for the developer as the lack of sufficient data. Ordinary statistical approach depending on large dataset has less convincible result for the developer to make decision. Prior to massive production, the computer manufacturer runs a life test by picking up a certain number of new computers to run to failure to enlarge the data set. Nevertheless, as the defect rate of the modern computer at this stage is very low, the life data are right-censored with high censoring rate that up to 90%. This paper adopts a moment method to analyze the life data to accommodate the highly censored problem, and a case study is presented to access the reliability. | en_US |
dc.identifier.citation | Yuan, Lu: Reliability Assessment of Computer in Design Phase Under High Censored Setting. In: . .. IEEM 2023 IEEE International Conference on Industrial Engineering and Engineering Management Singapore 18 - 21 December 2023, 2023. IEEE conference proceedings | en_US |
dc.identifier.cristinID | FRIDAID 2247430 | |
dc.identifier.doi | 10.1109/IEEM58616.2023.10406776 | |
dc.identifier.isbn | 9798350323153 | |
dc.identifier.uri | https://hdl.handle.net/10037/33055 | |
dc.language.iso | eng | en_US |
dc.publisher | IEEE | en_US |
dc.rights.accessRights | openAccess | en_US |
dc.rights.holder | Copyright 2023 The Author(s) | en_US |
dc.title | Reliability Assessment of Computer in Design Phase Under High Censored Setting | en_US |
dc.type.version | acceptedVersion | en_US |
dc.type | Chapter | en_US |
dc.type | Bokkapittel | en_US |