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dc.contributor.authorYuan, Fuqing
dc.contributor.authorLu, Jinmei
dc.date.accessioned2024-02-27T13:22:41Z
dc.date.available2024-02-27T13:22:41Z
dc.date.issued2023-02-01
dc.description.abstractAssessment of reliability of personal computer is a challenge for the developer as the lack of sufficient data. Ordinary statistical approach depending on large dataset has less convincible result for the developer to make decision. Prior to massive production, the computer manufacturer runs a life test by picking up a certain number of new computers to run to failure to enlarge the data set. Nevertheless, as the defect rate of the modern computer at this stage is very low, the life data are right-censored with high censoring rate that up to 90%. This paper adopts a moment method to analyze the life data to accommodate the highly censored problem, and a case study is presented to access the reliability.en_US
dc.identifier.citationYuan, Lu: Reliability Assessment of Computer in Design Phase Under High Censored Setting. In: . .. IEEM 2023 IEEE International Conference on Industrial Engineering and Engineering Management Singapore 18 - 21 December 2023, 2023. IEEE conference proceedingsen_US
dc.identifier.cristinIDFRIDAID 2247430
dc.identifier.doi10.1109/IEEM58616.2023.10406776
dc.identifier.isbn9798350323153
dc.identifier.urihttps://hdl.handle.net/10037/33055
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.rights.accessRightsopenAccessen_US
dc.rights.holderCopyright 2023 The Author(s)en_US
dc.titleReliability Assessment of Computer in Design Phase Under High Censored Settingen_US
dc.type.versionacceptedVersionen_US
dc.typeChapteren_US
dc.typeBokkapittelen_US


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